SPS - Instrumentation

INSTALLED INSTRUMENTATION

Device Material Length along the beam (m) Distance from the crystal (m) Alpha x Beta x (m) DX DPX MuX (deg)
TECS.51799 Goniometer N/A 900 1.4
TECS.51895 Goniometer N/A 900 0
XRPH.52202 Roman pot N/A 0.034 130.27054 -2.19745 94.74994 3.49859 0.009741 175.698
TALABS.52196 N/A N/A 0 129.09925 -2.12539 89.68666 3.3845 0.09741 174.9708
TALSI.52196 N/A N/A 0 128.31425 -2.0771 86.3877 3.30803 0.09741 174.4596
TACWE.51998 N/A N/A 0 65.21775 -2.13165 90.19583 0.00508 0.0096 87.8832
TACW.51998 Absorber Tungsten 0 64.91775 -2.11321 88.92237 0.0022 0.0096 87.6924
TACWS.51998 N/A N/A 0 64.61775 -2.09477 87.65998 -0.00068 0.0096 87.498
CPFM.51991 Cherenkov detector N/A 0 60.53125 -1.84359 71.5659 -0.03991 0.0096 84.5388
XRPH.51937 Roman pot N/A 0.034 44.49775 -0.85808 28.24862 -0.19384 0.0096 63.648
TCSME.51934 N/A N/A 0 42.87125 -0.75811 25.61988 -0.20945 0.0096 60.1812
TCSM.51934 Collimator N/A 0 42.37125 -0.72738 24.87713 -0.21425 0.0096 59.0472
TCSMS.51934 Collimator N/A 0 41.87125 -0.69665 24.16512 -0.21905 0.0096 57.8808
CRY2.51799 Crystal Silicon 0 1.895 -2.17414 93.08243 -0.86688 -0.01965 1.2204
CRY1.51799 Crystal Silicon 0 1.4 -2.14368 90.9451 -0.85715 -0.01965 0.9144
CRY4.51797 Crystal Silicon 0 0.495 -2.088 87.11543 -0.83937 -0.01965 0.3312
CRY3.51797 Crystal Silicon 0 0 -2.05755 85.06338 -0.82964 -0.01965 0
CRY5.51795 Crystal Silicon 0 -1.261 -1.97997 79.97207 -0.80486 -0.01965 -0.8748
SI.51794 Quartz linear Quartz 0 -1.848 -1.94385 77.66879 -0.79333 -0.01965 -1.3032
SC.51793 Scatter linear Graphite 0 -2.435 -1.90774 75.4079 -0.7818 -0.01965 -1.7424
TCXHW.51651 Scraper Tungsten 0 -49.502 1.87196 73.2181 -0.19011 -0.00534 -78.1704

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